PT-2018-1070 · Samsung · Exynos+1

Publicado 2018-01-04 · Atualizado 2020-08-24 · CVE-2018-5210

Positive Technologies (AI Summary)

CVSS v2.0

9.3

Alta

Vetor base

AV:N/AC:M/Au:N/C:C/I:C/A:C

Name of the Vulnerable Software and Affected Versions Samsung Mobile devices with N(7.x) software and Exynos chipsets

Description The issue is related to a stack buffer overflow in the Trustlet component of Samsung Mobile microprogram software and Exynos chipsets. This can be exploited by a remote attacker to execute arbitrary code in the Trusted Execution Environment (TEE) and gain access to sensitive information such as PIN codes, passwords, or screen unlock patterns, potentially using a brute-force attack.

Recommendations For Samsung Mobile devices with N(7.x) software and Exynos chipsets, at the moment, there is no information about a newer version that contains a fix for this vulnerability.

Buffer Overflow

Memory Corruption

Enumeração de Fraquezas

CWE-119

CWE-787

Identificadores relacionados

BDU:2018-00413

CVE-2018-5210

Produtos afetados

Exynos

Samsung Mobile

Referências · 5

• https://osv.dev/vulnerability/CVE-2018-5210 · Aviso do Fabricante
• https://security.samsungmobile.com/securityUpdate.smsb · Aviso do Fabricante
• https://nvd.nist.gov/vuln/detail/CVE-2018-5210 · Nota de Segurança
• https://cvedetails.com/cve/CVE-2018-5210 · Nota
• https://bdu.fstec.ru/vul/2018-00413 · Nota de Segurança