PT-2025-21337 · National Instruments · Ni Circuit Design Suite

Michael Heinzl · Published 2025-05-15 · Updated 2025-05-20 · CVE-2025-30420

Positive Technologies (AI Summary)

CVSS v3.1

7.8

High

Base vector

AV:L/AC:L/PR:N/UI:R/S:U/C:H/I:H/A:H

Name of the Vulnerable Software and Affected Versions: NI Circuit Design Suite versions 14.3.0 and prior

Description: The issue is due to a memory corruption vulnerability caused by an out of bounds read in Bitmap::InternalDraw() when using the SymbolEditor. This may result in information disclosure or arbitrary code execution. Successful exploitation requires an attacker to get a user to open a specially crafted .sym file.

Recommendations: For versions 14.3.0 and prior, update to a version later than 14.3.0 to resolve the issue. As a temporary workaround, consider avoiding the use of the SymbolEditor with untrusted .sym files until a patch is available. Restrict access to the Bitmap::InternalDraw() function to minimize the risk of exploitation.

Fix

Out of bounds Read

Weakness Enumeration

CWE-125

Related Identifiers

CVE-2025-30420

Affected Products

Ni Circuit Design Suite

References · 7

• https://ni.com/en/support/security/available-critical-and-security-updates-for-ni-software/memory-corruption-vulnerabilities-in-ni-circuit-design-suite.html · Vendor Advisory
• https://osv.dev/vulnerability/CVE-2025-30420 · Vendor Advisory
• https://nvd.nist.gov/vuln/detail/CVE-2025-30420 · Security Note
• https://t.me/cvetracker/23924 · Telegram Post
• https://twitter.com/CveFindCom/status/1923061601206239631 · Twitter Post
• https://t.me/cvenotify/123061 · Telegram Post
• https://twitter.com/CVEnew/status/1923064436472021443 · Twitter Post