PT-2025-23575 · Qualcomm · Snapdragon+4

Published 2025-06-03 · Updated 2025-08-20 · CVE-2024-53017

Positive Technologies (AI Summary)

CVSS v3.1

6.6

Medium

Base vector

AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Name of the Vulnerable Software and Affected Versions The product name cannot be determined.

Description The issue is related to memory corruption that occurs while handling a test pattern generator IOCTL command.

Recommendations At the moment, there is no information about a newer version that contains a fix for this vulnerability.

Weakness Enumeration

CWE-823

Related Identifiers

CVE-2024-53017

Affected Products

Snapdragon

Sdm429W Firmware

Snapdragon 429 Mobile Platform Firmware

Wcn3620 Firmware

Wcn3660B Firmware

References · 6

• https://nvd.nist.gov/vuln/detail/CVE-2024-53017 · Security Note
• https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html · Vendor Advisory
• https://t.me/cvenotify/124430 · Telegram Post
• https://t.me/cvetracker/25233 · Telegram Post
• https://twitter.com/CVEnew/status/1929785827564872087 · Twitter Post
• https://t.me/cveNotify/132945 · Telegram Post