PT-2025-2714 · Qualcomm · Snapdragon+21

Published 2025-02-03 · Updated 2025-02-03 · CVE-2024-45573

Positive Technologies (AI Summary)

CVSS v3.1

7.8

High

Base vector

AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Name of the Vulnerable Software and Affected Versions: No specific software or versions are mentioned in the provided descriptions.

Description: The issue is related to memory corruption that may occur while generating a test pattern due to negative indexing of the display ID. This can potentially cause damage to the memory.

Recommendations: At the moment, there is no information about a newer version that contains a fix for this issue.

Fix

Buffer Overflow

Weakness Enumeration

CWE-823

CWE-119

Related Identifiers

BDU:2025-05518

CVE-2024-45573

Affected Products

Snapdragon

Fastconnect 6700 Firmware

Fastconnect 6900 Firmware

Fastconnect 7800 Firmware

Qcs5430 Firmware

Qcs6490 Firmware

Sc8280Xp-Abbb Firmware

Sc8380Xp Firmware

Sdm429W Firmware

Snapdragon 429 Mobile Firmware

Snapdragon 7C+ Gen 3 Compute Firmware

Video Collaboration Vc3 Platform Firmware

Wcd9370 Firmware

Wcd9375 Firmware

Wcd9380 Firmware

Wcd9385 Firmware

Wcn3620 Firmware

Wcn3660B Firmware

Wsa8830 Firmware

Wsa8835 Firmware

Wsa8840 Firmware

Wsa8845 Firmware

References · 5

• https://docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.html · Vendor Advisory
• https://nvd.nist.gov/vuln/detail/CVE-2024-45573 · Security Note
• https://bdu.fstec.ru/vul/2025-05518 · Security Note
• https://twitter.com/CVEnew/status/1886462821073818103 · Twitter Post
• https://t.me/cvedetector/17099 · Telegram Post