PT-2025-35883 · Unknown · Lwis Device Test

Published 2025-09-04 · Updated 2025-09-04 · CVE-2025-36900

Positive Technologies (AI Summary)

CVSS v3.1

6.7

Medium

Base vector

AV:L/AC:L/PR:H/UI:N/S:U/C:H/I:H/A:H

Name of the Vulnerable Software and Affected Versions lwis device test (affected versions not specified)

Description An out-of-bounds write issue exists in the lwis test register io function within lwis device test.c. This issue is due to an integer overflow and could lead to local privilege escalation. System execution privileges are required for exploitation, and user interaction is not needed.

Recommendations At the moment, there is no information about a newer version that contains a fix for this vulnerability.

Integer Overflow

Weakness Enumeration

CWE-190

Related Identifiers

CVE-2025-36900

Affected Products

Lwis Device Test

References · 4

• https://source.android.com/security/bulletin/pixel/2025-09-01 · Vendor Advisory
• https://nvd.nist.gov/vuln/detail/CVE-2025-36900 · Security Note
• https://t.me/CVEtracker/31677 · Telegram Post
• https://twitter.com/CVEnew/status/1963470920041075131 · Twitter Post